Deep-Learning Methods for Defect Inspection of Plated Through Holes With Clustering-Based Auto-Labeling and GAN-Based Model Training
Deep-Learning Methods for Defect Inspection of Plated Through Holes With Clustering-Based Auto-Labeling and GAN-Based Model Training
| 年份 | 2024 |
| 作者 | |
| Created date | 2026-09-19 |
| 作者順序 | 第三作者 |
| 通訊作者 | 否 |
| 發表年份 | 2024 |
| 發表月份 | 12 |
| 期刊名稱 | IEEE Access |
| 出版地國別/地區 | 美國 |
| 發表卷數 | 12 |
| 發表期數 | 0 |
| 發表型式 | |
| 審稿制度 | 是 |
| 出版語言 | 外文 |