Deep-Learning Methods for Defect Inspection of Plated Through Holes With Clustering-Based Auto-Labeling and GAN-Based Model Training

Deep-Learning Methods for Defect Inspection of Plated Through Holes With Clustering-Based Auto-Labeling and GAN-Based Model Training

助理教授      
年份2024
作者
Created date2026-09-19
作者順序第三作者
通訊作者
發表年份2024
發表月份12
期刊名稱IEEE Access
出版地國別/地區美國
發表卷數12
發表期數0
發表型式
審稿制度
出版語言外文