Deep-Learning-Based Defective Bean Inspection with GAN-Structured Automated Labeled Data Augmentation in Coffee Industry
| Year | 2019 |
| Author | Yung-Chien Chou, Cheng-Ju Kuo, Tzu-Ting Chen, Gwo-Jiun Horng, 白貿元*, Mu-En Wu, Yu-Chuan Lin, Min-Hsiung Hung, Wei-Tsung Su, Yi-Chung Chen, Ding-Chau Wang, Chao-Chun Chen |
| Author count | 12 |
| Created date | 2019-12-09 |
| Author order | 第四(以上)作者 |
| Corresponding author | 是 |
| Publication year | 2019 |
| Publication month | 10 |
| Journal name | Applied Sciences |
| Journal sponsor | MDPI |
| Publication area | 瑞士聯邦 |
| Volume | 9 |
| Issue | 19 |
| Start page | 1 |
| End page | 26 |
| Publication type | |
| Review system | 是 |
| Language | Foreign Language |
| Attached project | (MOST108-2218-E-020-003-) |