Decay Mechanisms of Lumen and Chromaticity for High-Power Phosphor-Based White-Light-Emitting Diodes in Thermal Aging

Decay Mechanisms of Lumen and Chromaticity for High-Power Phosphor-Based White-Light-Emitting Diodes in Thermal Aging

教授    7008    ychsux@mail.npust.edu.tw
年份2008
作者許益誠*
Author count1
Created date2019-02-19
作者順序1
通訊作者false
發表年份2008
會議名稱Electronics and Components Technology Conference (ECTC 2008)
會議起始頁碼779
會議結束頁碼782
舉行之城市Buena Vista Lake, Florida
舉行之國家中華民國
開始日期2008-05-27
結束日期2008-05-27
審稿制度
發表語言外文