The Development of binocular Disparity Technique for Printed Circuit Board Defect Inspection
| Year | 2014 |
| Author | 李文宗* |
| Author count | 1 |
| Created date | 2019-02-19 |
| Author order | 第一作者 |
| Corresponding author | 是 |
| Publication year | 2014 |
| Publication month | 10 |
| Journal name | International Journal of Computer Science Engineering and Information Technology Research |
| Journal sponsor | TJPRC |
| Publication area | 中華民國 |
| Volume | 4 |
| Issue | 5 |
| Start page | 57 |
| End page | 64 |
| Publication type | |
| Review system | 否 |
| Language | Foreign Language |
| Attached project | 無 |