Study on Photoelectric Properties of OEL Double Buffer Layer CuPc and m-MTDATA by Thermal Annealing

Study on Photoelectric Properties of OEL Double Buffer Layer CuPc and m-MTDATA by Thermal Annealing

Associate Professor    7027    ntchen@mail.npust.edu.tw
Year2017
Author
Created date2019-03-27
Author order1
Corresponding authortrue
Publication year2017
Symposium name2017年 奈米技術與材料研討會
Publication city彰化大葉大學
Publication country中華民國
Start date2017-11-17
End date2017-11-17
Review system
LanguageTraditional Chinese