Shear Strength and Failure Behavior of SnAgSb Solder Joints with Au/Ni-P/Cu UBM
Year | 2008 |
Author | H.T. Lee*, S.Y. Hu, 洪廷甫, Y.F. Chen |
Author count | 4 |
Created date | 2019-02-19 |
Author order | 第三作者 |
Corresponding author | 否 |
Publication year | 2008 |
Publication month | 6 |
Journal name | Journal of Electronic Materials |
Journal sponsor | TMS |
Publication area | 中華民國 |
Volume | 37 |
Issue | 6 |
Start page | 867 |
End page | 873 |
Publication type | |
Review system | 否 |
Language | Foreign Language |
Attached project | 無 |