Nano-scale Measurement using the Direct Gray-level Method by Holographic Interferometry
| Year | 2003 |
| Author | 陳永昌, Chi-Hui Chien*, Yii-Der Wu, Chi-Chang Hsieh |
| Author count | 4 |
| Created date | 2019-02-19 |
| Author order | 1 |
| Corresponding author | false |
| Publication year | 2003 |
| Symposium name | SEM Annual Conference & Exposition on Experimental and Applied Mechanics |
| Start page | 1 |
| End page | 8 |
| Publication city | Charlotte, North Carolina |
| Publication country | 中華民國 |
| Start date | 2003-06-02 |
| End date | 2003-06-02 |
| Review system | 否 |
| Language | Foreign Language |