Microstructure and electrical property of tantalum oxynitride thin films preparedusing high-power impulse reactive magnetron sputtering
Microstructure and electrical property of tantalum oxynitride thin films preparedusing high-power impulse reactive magnetron sputtering
Year | 2020 |
Author | 李英杰* |
Author count | 1 |
Created date | 2021-03-24 |
Author order | 第三作者 |
Corresponding author | 是 |
Publication year | 2020 |
Publication month | 10 |
Journal name | Japanese Journal of Applied Physics, |
Publication area | 日本 |
Volume | 59 |
Issue | 11 |
Start page | 11650 |
End page | 11650 |
Publication type | |
Review system | 是 |
Language | Traditional Chinese |