Investigation of Ce:YAG Doping Effect on Thermal Aging for High-Power Phosphor-Converted White-Light-Emitting Diodes
| Year | 2009 |
| Author | 許益誠* |
| Author count | 1 |
| Created date | 2019-02-19 |
| Author order | 第一作者 |
| Corresponding author | 是 |
| Publication year | 2009 |
| Publication month | 9 |
| Journal name | IEEE Trans. On Device and Materials Reliability |
| Publication area | 中華民國 |
| Volume | 9 |
| Issue | 3 |
| Start page | 367 |
| End page | 371 |
| Publication type | |
| Review system | 否 |
| Language | Foreign Language |
| Attached project | 無 |