Growth and Characterization of ZnSe on Si by Atomic Layer Epitaxial

Growth and Characterization of ZnSe on Si by Atomic Layer Epitaxial

Associate Professor    7027    ntchen@mail.npust.edu.tw
Year2000
Author
Created date2019-02-19
Author order第四(以上)作者
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Publication year2000
Publication month1
Journal nameJ. Cryst. Growth
Publication area中華民國
Publication type
Review system
LanguageTraditional Chinese
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