Effect of Annealing on Microstructure and Dielectric Properties of Zn2Ti3O8 Thin Films by Reactive Co-sputtering
Effect of Annealing on Microstructure and Dielectric Properties of Zn2Ti3O8 Thin Films by Reactive Co-sputtering
Year | 2011 |
Author | Y. L. Huang*, 李英杰, D. C. Tsai, D. R. Jung, F. S. Shieu |
Author count | 5 |
Created date | 2019-02-19 |
Author order | 2 |
Corresponding author | false |
Publication year | 2011 |
Symposium name | TACT 2011 International Thin Films Conference |
Publication city | Kenting |
Publication country | 中華民國 |
Start date | 2011-11-23 |
End date | 2011-11-23 |
Review system | 否 |
Language | Foreign Language |