Effect of Annealing on Microstructure and Dielectric Properties of Zn2Ti3O8 Thin Films by Reactive Co-sputtering
Effect of Annealing on Microstructure and Dielectric Properties of Zn2Ti3O8 Thin Films by Reactive Co-sputtering
| Year | 2011 |
| Author | Y. L. Huang*, 李英杰, D. C. Tsai, D. R. Jung, F. S. Shieu |
| Author count | 5 |
| Created date | 2019-02-19 |
| Author order | 2 |
| Corresponding author | false |
| Publication year | 2011 |
| Symposium name | TACT 2011 International Thin Films Conference |
| Publication city | Kenting |
| Publication country | 中華民國 |
| Start date | 2011-11-23 |
| End date | 2011-11-23 |
| Review system | 否 |
| Language | Foreign Language |