Effect of AlN Film Thickness Effects on Photo / Dark Current of MSM UV Photodetector

Effect of AlN Film Thickness Effects on Photo / Dark Current of MSM UV Photodetector

Year2008
Author楊茹媛*, , , ,
Author count5
Created date2019-02-19
Author order第一作者
Corresponding author
Publication year2008
Publication month11
Journal nameMicrowave & Optical Technology Letters
Publication area中華民國
Volume50
Start page2863
End page2866
Publication type
Review system
LanguageForeign Language
Attached project