Decay Mechanisms of Lumen and Chromaticity for High-Power Phosphor-Based White-Light-Emitting Diodes in Thermal Aging
Decay Mechanisms of Lumen and Chromaticity for High-Power Phosphor-Based White-Light-Emitting Diodes in Thermal Aging
Year | 2008 |
Author | 許益誠* |
Author count | 1 |
Created date | 2019-02-19 |
Author order | 1 |
Corresponding author | false |
Publication year | 2008 |
Symposium name | Electronics and Components Technology Conference (ECTC 2008) |
Start page | 779 |
End page | 782 |
Publication city | Buena Vista Lake, Florida |
Publication country | 中華民國 |
Start date | 2008-05-27 |
End date | 2008-05-27 |
Review system | 否 |
Language | Foreign Language |