BGA IC外觀檢測系統之開發

BGA IC外觀檢測系統之開發

Associate Professor    7015    linyh@mail.npust.edu.tw
Year2005
Author林宜弘*
Author count1
Created date2019-02-19
Author order1
Corresponding authorfalse
Publication year2005
Symposium name第五屆全國AOI論壇與展覽
Publication country中華民國
Start date2005-10-01
End date2005-10-01
Review system
LanguageTraditional Chinese