A Refined Finite Element Model Verification for IC Packaged PCB with Thermal Effects

A Refined Finite Element Model Verification for IC Packaged PCB with Thermal Effects

Professor    7017    wangbt@mail.npust.edu.tw
Year2010
Author王栢村*, Xiu-Wei Liang,
Author count3
Created date2019-02-19
Author order1
Corresponding authorfalse
Publication year2010
Symposium nameThe 5th International Microsystems,Packaging,Assembly and Circuits Technology Conference(IMPACT 2010)
Publication city台北
Publication country中華民國
Start date2010-10-20
End date2010-10-20
Review system
LanguageForeign Language