A Refined Finite Element Model Verification for IC Packaged PCB with Thermal Effects

A Refined Finite Element Model Verification for IC Packaged PCB with Thermal Effects

Professor    7017    wangbt@mail.npust.edu.tw
Year2010
Author王栢村*, Xiu-Wei Liang, Fu-Xiang Hsu, Yi-Shao Lai, Chang-Lin Yeh, Ying-Chih Lee
Author count6
Created date2019-02-19
Author order第一作者
Corresponding author
Publication year2010
Publication month1
Journal nameASE Technology Journal
Publication area中華民國
Volume3
Issue2
Start page146
End page153
Publication type
Review system
LanguageForeign Language
Attached project