A Double-Stress Accelerated Life Testing for Rectifier Diode
| Year | 2019 |
| Author | 吳繼澄 |
| Author count | 1 |
| Created date | 2020-03-23 |
| Author order | 1 |
| Corresponding author | true |
| Publication year | 2019 |
| Symposium name | 2019中華創新管理學會學術暨實務研討會 |
| Publication city | 台中 |
| Publication country | 中華民國 |
| Start date | 2019-06-01 |
| End date | 2019-06-01 |
| Review system | 是 |
| Language | Traditional Chinese |