應用全像干涉術量測覆晶構裝體填充膠與基板介面缺陷之研究
| Year | 2003 |
| Author | 陳永昌* |
| Author count | 1 |
| Created date | 2019-02-19 |
| Author order | 1 |
| Corresponding author | false |
| Publication year | 2003 |
| Symposium name | 精密機械與製造技術研討會 |
| Publication country | 中華民國 |
| Start date | 2003-06-01 |
| End date | 2003-06-01 |
| Review system | 否 |
| Language | Traditional Chinese |