Nano-scale Measurement using the Direct Gray-level Method by Holographic Interferometry

Nano-scale Measurement using the Direct Gray-level Method by Holographic Interferometry

Associate Professor    08-7703202#7454、(L)7480    c123@mail.npust.edu.tw
Year2003
Author陳永昌, Chi-Hui Chien*, Yii-Der Wu, Chi-Chang Hsieh
Author count4
Created date2019-02-19
Author order1
Corresponding authorfalse
Publication year2003
Symposium nameSEM Annual Conference & Exposition on Experimental and Applied Mechanics
Start page1
End page8
Publication cityCharlotte, North Carolina
Publication country中華民國
Start date2003-06-02
End date2003-06-02
Review system
LanguageForeign Language