陰影疊紋法應用在IC封裝翹曲檢測系統之開發

陰影疊紋法應用在IC封裝翹曲檢測系統之開發

Associate Professor    7015    linyh@mail.npust.edu.tw
Year2006
Author林宜弘*
Author count1
Created date2019-02-19
Author order1
Corresponding authorfalse
Publication year2006
Symposium nameAOI Forum & Show 2006第六屆全國AOI論壇與展覽
Publication country中華民國
Start date2006-07-01
End date2006-07-01
Review system
LanguageTraditional Chinese