The Development of Binocular Disparity Technique for Printed Circuit Board Defect Inspection
| Year | 2004 |
| Author | Hwang, Shyh-Shin |
| Author count | 1 |
| Created date | 2019-03-26 |
| Author order | 第一作者 |
| Corresponding author | 是 |
| Publication year | 2004 |
| Publication month | 10 |
| Journal name | International Journal of Computer Science Engineering and Information Technology Research |
| Journal sponsor | Transstellar Journal Publications and Research Consultancy Pvt. Ltd. |
| Publication area | 美國 |
| Volume | 4 |
| Issue | 5 |
| Start page | 57 |
| End page | 64 |
| Publication type | |
| Review system | 是 |
| Language | Foreign Language |
| Attached project | 無 |