Nanoscale Deformation Measurement using the Gray-level Method by Holographic Interferometry

Nanoscale Deformation Measurement using the Gray-level Method by Holographic Interferometry

Associate Professor    08-7703202#7454、(L)7480    c123@mail.npust.edu.tw
Year2006
AuthorChien C.H., Wu Y.D., Chiou Y.T., Hsieh C.C., 陳永昌*, Chen T.P., Tsai M.L., Wang C.T.
Author count8
Created date2019-02-19
Author order第四(以上)作者
Corresponding author
Publication year2006
Publication month1
Journal nameOptics and Lasers in Engineering
Publication area中華民國
Start page80
End page91
Publication type
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LanguageForeign Language
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