Nanoscale Deformation Measurement using the Gray-level Method by Holographic Interferometry
| Year | 2006 |
| Author | Chien C.H., Wu Y.D., Chiou Y.T., Hsieh C.C., 陳永昌*, Chen T.P., Tsai M.L., Wang C.T. |
| Author count | 8 |
| Created date | 2019-02-19 |
| Author order | 第四(以上)作者 |
| Corresponding author | 是 |
| Publication year | 2006 |
| Publication month | 1 |
| Journal name | Optics and Lasers in Engineering |
| Publication area | 中華民國 |
| Start page | 80 |
| End page | 91 |
| Publication type | |
| Review system | 否 |
| Language | Foreign Language |
| Attached project | 無 |